Hewlett Packard
4145A

Designed for production line and laboratory use, the Hewlett Packard 4145 A is a stand-alone instrument, capable of complete DC characterization of semiconductor devices and materials.

It stimulates voltage and current sensitive devices, measures the resulting current and voltage responses, and displays the results in an userselectable format (graph, list, matrix) on a built-in CRT display.

An on-board programmable calculator provides real-time calculation of voltage / current dependent parameters, such as the current gain (hFE) and transconductance (gm) of transistors, which also can be displayed on the CRT.

A number of powerful graphic analysis tools - marker, cursor, line function, interpolation, enhance the HP 4145A’s basic capabilities and provide fast, accurate analysis of semiconductor devices.

Four built-in stimulus / measurement units (SMUs) can be independently programmed to function as either a voltage source/current monitor or a current source/voltage monitor.

• Current range: 1pA to 100mA
  
• Voltahe range: 1 mV to 100 V

Thus, a bipolar transistor, for example, can be completely characterized in common-base, common-emitter, and common-collector configurations without changing connections - only changing the SMU’s operating modes is required.

The HP 4145 A is also equipped with two voltage sources and two voltage monitors for measurements on devices having more than four terminals, such as ICs.

It can be controlled from the front panel, via the HP-IB (standard), or by measurement setups stored on flexible discs.

Displayed information - measurement setups, auto-sequence programs, measurement results - can be dumped directly onto an external digital printer / plotter to obtain publication quality hard copies.
Also, measurement results can be sent via HP-IB to a computer for further processing.

Please find a corresponding data sheet here.